Specifications | |
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Dimensions | 190 x 265 x 316 mm |
Weight | 12Kg |
Type | Manual |
Measuring Sample Size | ≤ 4" |
Measurement Method | Non-contact |
Measurement Principle | Reflectometer |
Features | Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows Based User-friendly Interface Print Function of Each View & Data Saving *Supporting up to 3 Layers *Supporting Backside Reflection |
Feature | |
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Stage Size | 150 x 120mm(70 x 50mm Travel Distance) |
Measurement Range | 200Å~ 35㎛(Depends on Film Type) |
Spot size | 20㎛ Typically |
Measurement Speed | 1~2 sec./site |
Application Areas | Polymers : PVA, PET, PP, PR ... Dielectrics : Semiconductors : Poly-Si, GaAs, GaN, InP, ZnS... |
Option | Reference Sample(K-MAC or KRISS or NIST) |
Head | Trinocular Head |
Nosepiecs | Quadruple Revolving Mechanism with Inward Tilt |
Type of Illumination | 12V 35W Halogen Lamp Built-in Control Device & Transformer |